Professor Cev Noyan Receives Jenkins Award at X-Ray Conference

Aug 12 2015

Professor I.C. “Cev” Noyan, chair of the Department of Applied Physics and Applied Mathematics and a professor of materials science and engineering and of earth and environmental engineering, was honored by the International Centre for Diffraction Data with its Jenkins Lifetime Achievement Award, the most prestigious honor for scientists who advance the use of x-rays in materials analysis, at the Centre’s Denver X-Ray Conference in August.

Thomas Blanton, left, principal scientist of the International Centre for Diffraction Data, presented Noyan with the award.


The Jenkins award recognized Noyan’s contributions to the development of residual stress measurements and their applications in materials science and for his teaching and research in neutron and x-ray diffraction methods for analyses of micro- and nano-scale structures. The biennial award is named for Ron Jenkins, a leader and pioneer in the field of x-ray analysis.

“It is a great honor to receive this recognition and it is especially meaningful because I had known Ron Jenkins for almost 20 years. He was a great diffractionist, an excellent teacher, and had a wonderful sense of humor. I truly treasure the memory of our arguments.”

Since 1978, Noyan has been advancing the study of the mechanical response of crystalline materials over various length scales using diffraction. He was one of the first researchers to combine the theory of micromechanics with that of x-ray and neutron diffraction. His x-ray and neutron characterization techniques for non-destructive analysis of structures have applications that range from suspension bridge cables to nanostructures and integrated circuitry. He and his research group also work on the theory of scattering, especially fine-tuning the measurement of diffraction data and quantifying uncertainties.

A fellow of the American Physical Society, Noyan’s early research work was at IBM, where he received two IBM Outstanding Technical Achievement Awards for research and development of computer and packaging structures, an IBM Research Division Award for research on diffusion barriers, and 11 IBM Invention Plateaus for filed patents. He is also coauthor of the monograph, Residual Stress: Measurement by Diffraction and Interpretation (Materials Research and Engineering).

Noyan presented a workshop at the conference, “Stress-measurement of residual and applied stress with diffraction.” In addition, APAM graduate student Hande Ozturk received the Best Student Poster Award for her work entitled, “Sampling and Intensity Statistics of Diffraction from Nanocrystalline Powder Aggregates.”