Cevdet Noyan


208 & 1120 S.W. Mudd
Mail Code 4701

Tel(212) 854-8919
Fax(212) 854-8257

Cevdet Noyan has been studying the mechanical response of crystalline materials over various length scales using diffraction since 1978. He was one of the first researchers to combine the theory of micromechanics with that of x-ray and neutron diffraction. He and his group develop x-ray and neutron characterization techniques for non-destructive analysis of structures, with applications spanning suspension bridge cables, integrated circuits, and nanostructures. Noyan and his co-workers also work on the theory of scattering, with particular emphasis on defining the information volumes from which diffraction data are measured, and quantification of the uncertainties associated with such data. 

Research Interests

characterization and modeling of mechanical and micromechanical deformation; residual stress analysis and nondestructive testing; x-ray and neutron diffraction, microdiffraction analysis

Noyan received his B.S. in Metallurgical Engineering from the Middle East Technical University in Ankara, Turkey, in 1978 and his Ph.D. in Materials Science and Engineering from Northwestern University in 1984. His early research work was at IBM, where he received two IBM Outstanding Technical Achievement Awards for research and development of computer and packaging structures, an IBM Research Division Award for research on diffusion barriers, and 11 IBM Invention Plateaus for filed patents. He is also coauthor of the monograph, Residual Stress: Measurement by Diffraction and Interpretation (Materials Research and Engineering).

Noyan is a member of the organizing committee of the Denver X-ray Conference and co-editor of the Advances in X-Ray Analysis. He is a fellow of the American Physical Society, received the Blackall Machine Tool and Gage Award from the American Society of Mechanical Engineers in 2006, and received the International Centre for Diffraction Data’s 2015 Jenkins Lifetime Achievement Award, an honor for scientists who advance the use of x-rays in materials analysis.



  • Postdoctoral fellow, Northwestern University, Evanston, IL (1983-1985)


  • APAM Department Chair, Columbia University, 2012–
  • Professor of Earth and Environmental Engineering, Columbia University, 2009–
  • Professor of Materials Science and Engineering, Columbia University, 2004–
  • Adjunct Professor, Columbia University, 1985 – 2004
  • Research Consultant, IBM Corporation, Yorktown Heights, 2004–
  • Visiting Professor, Materials Science and Engineering, Kanazawa University, Japan, 1994, 2001
  • Research Staff Member, IBM Corporation, Yorktown Heights, 1985 - 2004


  • Fellow, American Physical Society
  • Member ASM, TMS-AIME, ACA, APS, Sigma Xi, IEEE, ICDD
  • Organizing Board Member, responsible for residual stress issues, Denver X-ray Conference


  • Jenkins Lifetime Achievement Award, International Centre for Diffraction Data, 2015
  • Blackall Machine Tool and Gage Award, American Society of Mechanical Engineers, 2006
  • Two IBM Outstanding Technical Achievement Awards for research and development of computer and packaging structures
  • IBM Research Division Award for research on diffusion barriers and 11 IBM Invention Plateaus for filed patents
  • Adjunct Faculty Award for excellence in teaching, Columbia University, 1993


  • Brügger, A., S-Y. Lee, J. A. A. Mills, R. Betti, and I. C. Noyan, "Partitioning of Clamping Strains in a Nineteen Parallel Wire Strand," Experimental Mechanics, 1-17 (2017)
  • Noyan, I. C., "X-ray scattering from semiconductors and other materials," Crystallography Reviews, 22: 142-144 (2016)
  • Murray, Conal E., Mikhail Treger, I. C. Noyan, and Robert Rosenberg, "Evolution of Strain Energy During Recrystallization of Plated Cu Films," IEEE Transactions on Device and Materials Reliability, 16, 4: 440-445 (2016)
  • Treger, Mikhail, Christian Witt, Cyril Cabral, Conal Murray, Jean Jordan-Sweet, Robert Rosenberg, Eric Eisenbraun, and I. C. Noyan, "Prediction of recrystallization times in electroplated copper thin films," Thin Solid Films 615: 107-115 (2016)
  • Ramirez-Rico, J., S-Y. Lee, J. J. Ling, and I. C. Noyan, "Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus," Journal of Materials Science, 51, 11: 5343-5355 (2016)
  • Ozturk, H., H.F. Yan, J.P. Hill, I.C. Noyan, “Sampling statistics of diffraction from nanoparticle powder aggregates,” Journal Of Applied Crystallography, 47: 1016-1025 (2014)
  • Lee, Seung-Yub, H. Skorpenske, A.D. Stoica, K. An, X-L Wang, I. C. Noyan, “Measurement of Interface Thermal Resistance with Neutron Diffraction,” Journal of Heat Transfer, 136, 3: 031302, (2014)